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Graphene : Nano patterning for Graphene Device

  • Patterning using scanning probe microscopy
  • Studies on the etching and peeling using SPL method in graphene and graphite.
  • Oxidation and eching condition by tip bias voltage and time.

    • A checkerboard pattern on HOPG was fabricated, and imaged by contact-mode AFM (a-b), LFM (c-d), and noncontact mode AFM (e), where (a) and (c) were taken in left-to-right scan direction, and (b) and (d) in right-to-left. (f) shows the line profile of noncontact mode AFM image.

Department of Nano Science and Technology, Sejong University.